Statistical methods for the correction of tip convolution effects in STM imaging of nanometer size particles in metal-C : H films

Author: Schiffmann K.I.   Fryda M.   Goerigk G.   Lauer R.   Hinze P.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.66, Iss.3, 1996-12, pp. : 183-192

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Abstract