Interference effects in inelastic thickness fringes

Author： Nelhiebel M.   Schenner M.   Schattschneider P.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.66, Iss.3, 1996-12, pp. : 173-181

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

On the interpretation of Lorentz and holographic interference images of superconducting fluxons: - the influence of the specimen thickness

By Patti R.   Pozzi G.  

Ultramicroscopy, Vol. 77, Iss. 3, 1999-07 ,pp. : 163-175

Elsevier

Access to resources Recommend Favorite

Application of Nomarski interference contrast microscopy as a thickness monitor in the preparation of transparent, SiC-based, cross-sectional TEM samples

By Preble E.A.   McLean H.A.   Kiesel S.M.   Miraglia P.   Albrecht M.   Davis R.F.  

Ultramicroscopy, Vol. 92, Iss. 3, 2002-08 ,pp. : 265-271

Elsevier

Access to resources Recommend Favorite

Practical aspects of atomic resolution imaging and analysis in STEM - resolution and thickness effects

By James E.M.   Browning N.D.  

Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. : 125-139

Elsevier

Access to resources Recommend Favorite

Inelastic electron holography

By Lichte H.   Freitag B.  

Ultramicroscopy, Vol. 81, Iss. 3, 2000-04 ,pp. : 177-186

Elsevier

Access to resources Recommend Favorite

Delocalization in inelastic scattering

By Muller D.A.   Silcox J.  

Ultramicroscopy, Vol. 59, Iss. 1, 1995-07 ,pp. : 195-213

Elsevier

Access to resources Recommend Favorite