Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation

Author： Anczykowski B.   Kruger D.   Babcock K.L.   Fuchs H.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.66, Iss.3, 1996-12, pp. : 251-259

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Spatially resolved force spectroscopy of biological surfaces using the atomic force microscope

By Heinz W.F.   Hoh J.H.  

Trends in Biotechnology, Vol. 17, Iss. 4, 1999-04 ,pp. : 143-150

Elsevier

Access to resources Recommend Favorite

Optimization of experiment in scanning force microscopy of polymers

By Wawkuschewski A.   Cramer K.   Cantow H.-J.   Magonov S.N.  

Ultramicroscopy, Vol. 58, Iss. 2, 1995-05 ,pp. : 185-196

Elsevier

Access to resources Recommend Favorite

Problems in temperature control performing in situ investigations with the scanning force microscope

By Kipp S.   Lacmann R.   Schneeweiss M.A.  

Ultramicroscopy, Vol. 57, Iss. 4, 1995-03 ,pp. : 333-335

Elsevier

Access to resources Recommend Favorite

Application of dynamic impedance spectroscopy to atomic force microscopy

By  

Science and Technology of Advanced Materials, Vol. 9, Iss. 4, 2008-12 ,pp. : 136-140

IOP Publishing

Access to resources Recommend Favorite

Imaging elastic sample properties with an atomic force microscope operating in the tapping mode

By Hoper R.   Gesang T.   Possart W.   Hennemann O.-D.   Boseck S.  

Ultramicroscopy, Vol. 60, Iss. 1, 1995-08 ,pp. : 17-24

Elsevier

Access to resources Recommend Favorite