Imaging elastic sample properties with an atomic force microscope operating in the tapping mode

Author: Hoper R.   Gesang T.   Possart W.   Hennemann O.-D.   Boseck S.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.60, Iss.1, 1995-08, pp. : 17-24

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Abstract