An approach to quantitative high-resolution transmission electron microscopy of crystalline materials

By Kisielowski C.   Schwander P.   Baumann F.H.   Seibt M.   Kim Y.   Ourmazd A.  

Ultramicroscopy, Vol. 58, Iss. 2, 1995-05 ,pp. : 131-155

Elsevier

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The effects of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection

By R. Meyer R.   Kirkland A.  

Ultramicroscopy, Vol. 75, Iss. 1, 1998-10 ,pp. : 23-33

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Reconstruction of the projected crystal potential from a periodic high-resolution electron microscopy exit plane wave function

By Lentzen M.   Urban K.  

Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. : 89-102

Elsevier

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On the monochromatisation of high brightness electron sources for electron microscopy

By Mook H.W.   Kruit P.  

Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. : 43-51

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Electron differential microscopy using an electron trapezoidal prism

By Tanji T.   Manabe S.   Yamamoto K.   Hirayama T.  

Ultramicroscopy, Vol. 75, Iss. 4, 1999-01 ,pp. : 197-202

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