Surface modification and imaging of hydrogen passivated silicon with a combined scanning electron/scanning tunneling microscope

Author: Coope R.J.N.   Tiedje T.   Konsek S.L.   Pearsall T.P.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.68, Iss.4, 1997-08, pp. : 257-266

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Abstract