Author: Hsu J.H. Wei P.K. Fann W.S. Chuang K.R. Chen S.A.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.71, Iss.1, 1998-03, pp. : 263-267
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract