Polarization effect in scanning near-field optic/atomic-force microscopy (SNOM/AFM)

Author： Nakajima K. Mitsuoka Y. Chiba N. Muramatsu H. Ataka T. Sato K. Fujihira M.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.71, Iss.1, 1998-03, pp. : 257-262

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