Measurements of lateral distribution of fluorescence intensities and fluorescence spectra of microareas by a combined SNOM and AFM

By Fujihira M.   Monobe H.   Muramatsu H.   Ataka T.  

Ultramicroscopy, Vol. 57, Iss. 2, 1995-02 ,pp. : 118-123

Elsevier

Access to resources Recommend Favorite

Nanoscale photoluminescence mapping for MOVPE InN films using scanning near-field optical microscopy (SNOM)

By  

Science and Technology of Advanced Materials, Vol. 7, Iss. 3, 2006-04 ,pp. : 54-57

IOP Publishing

Access to resources Recommend Favorite

Diffraction contrast analysis of 90° and 180° ferroelectric domain structures of PbTiO3 thin films

By  

Science and Technology of Advanced Materials, Vol. 12, Iss. 3, 2011-06 ,pp. : 57-62

IOP Publishing

Access to resources Recommend Favorite

Imaging of fullerene-like structures in CN x thin films by electron microscopy; sample preparation artefacts due to ion-beam milling

By Czigany Z.   Neidhardt J.   Brunell I.F.   Hultman L.  

Ultramicroscopy, Vol. 94, Iss. 3, 2003-04 ,pp. : 163-173

Elsevier

Access to resources Recommend Favorite

Near-field optical microscopic recording on Langmuir-Blodgett (LB) films and chemically modified surfaces

By Fujihira M.   Monobe H.   Muramatsu H.   Ataka T.  

Ultramicroscopy, Vol. 57, Iss. 2, 1995-02 ,pp. : 176-179

Elsevier

Access to resources Recommend Favorite