Imaging of fullerene-like structures in CN x thin films by electron microscopy; sample preparation artefacts due to ion-beam milling

Author： Czigany Z. Neidhardt J. Brunell I.F. Hultman L.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.94, Iss.3, 2003-04, pp. : 163-173

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