Author: Rossouw C.J. Dudarev S.L. Josefsson T.W. Allen L.J.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.72, Iss.1, 1998-04, pp. : 17-29
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Impact parameters for ionization by high-energy electrons
Ultramicroscopy, Vol. 80, Iss. 2, 1999-10 ,pp. :
By Chen J.H. Van Dyck D. de Beeck M.O. Van Landuyt J.
Ultramicroscopy, Vol. 69, Iss. 4, 1997-10 ,pp. :
Delocalization in inelastic scattering
Ultramicroscopy, Vol. 59, Iss. 1, 1995-07 ,pp. :
Inelastic scattering and holography
By Van Dyck D. Lichte H. Spence J.C.H.
Ultramicroscopy, Vol. 81, Iss. 3, 2000-04 ,pp. :