Author: Oxley M.P. Allen L.J.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.80, Iss.2, 1999-10, pp. : 125-131
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Interference experiments with energy filtered electrons
By Harscher A. Lichte H. Mayer J.
Ultramicroscopy, Vol. 69, Iss. 3, 1997-10 ,pp. :
By Chen J.H. Van Dyck D. de Beeck M.O. Van Landuyt J.
Ultramicroscopy, Vol. 69, Iss. 4, 1997-10 ,pp. :