Author： Cowley J.M. Dunin-Borkowski R.E. Hayward M.
Publisher： Elsevier
ISSN： 0304-3991
Source： Ultramicroscopy, Vol.72, Iss.3, 1998-05, pp. : 223-232
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Abstract
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The imaging properties of atomic focusers
Ultramicroscopy, Vol. 72, Iss. 3, 1998-05 ,pp. :
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