The enhancement of electron microscope resolution by use of atomic focusers

Author: Cowley J.M.   Spence J.C.H.   Smirnov V.V.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.68, Iss.2, 1997-06, pp. : 135-148

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Abstract