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By Miller P.D.   Murray Gibson J.  

Ultramicroscopy, Vol. 74, Iss. 4, 1998-09 ,pp. : 221-235

Elsevier

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Measurement of the remanent magnetization of single Co/Cu and Ni nanowires by off-axis TEM electron holography

By Beeli C.   Doudin B.   Ansermet J.-P.   Stadelmann P.A.  

Ultramicroscopy, Vol. 67, Iss. 1, 1997-06 ,pp. : 143-151

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Quantitative mapping of the magnetic induction distribution using Foucault images formed in a transmission electron microscope

By Daykin A.C.   Petford-Long A.K.  

Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. : 365-380

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A quantitative determination of the development of texture in thin films

By Lindsay R.   Chapman J.N.   Craven A.J.   McBain D.  

Ultramicroscopy, Vol. 80, Iss. 1, 1999-08 ,pp. : 41-50

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Interpretable resolution of 0.2 nm at 100 kV using electron holography

By Harscher A.   Lang G.   Lichte H.  

Ultramicroscopy, Vol. 58, Iss. 1, 1995-04 ,pp. : 79-86

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