A quantitative determination of the development of texture in thin films

Author： Lindsay R.   Chapman J.N.   Craven A.J.   McBain D.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.80, Iss.1, 1999-08, pp. : 41-50

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Connecting small-angle diffraction with real-space images by quantitative transmission electron microscopy of amorphous thin-films

By Miller P.D.   Murray Gibson J.  

Ultramicroscopy, Vol. 74, Iss. 4, 1998-09 ,pp. : 221-235

Elsevier

Access to resources Recommend Favorite

Towards quantitative electron holography of magnetic thin films using in situ magnetization reversal

By Dunin-Borkowski R.E.   McCartney M.R.   Smith D.J.   Parkin S.S.P.  

Ultramicroscopy, Vol. 74, Iss. 1, 1998-07 ,pp. : 61-73

Elsevier

Access to resources Recommend Favorite

Determination of Cr particle sizes in thin dilute Cr-in-Cu films from measurement statistics

By Klotzkin D.   Isaacson M.  

Ultramicroscopy, Vol. 58, Iss. 3, 1995-06 ,pp. : 261-267

Elsevier

Access to resources Recommend Favorite

Ultrafast measurement in GaAs thin films using NSOM

By Smith S.   Holme N.C.R.   Orr B.   Kopelman R.   Norris T.  

Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 213-223

Elsevier

Access to resources Recommend Favorite

Superconducting properties of iron chalcogenide thin films

By  

Science and Technology of Advanced Materials, Vol. 13, Iss. 5, 2012-10 ,pp. : 42-62

IOP Publishing

Access to resources Recommend Favorite