Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.74, Iss.3, 1998-08, pp. : 123-130
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Polycrystal orientation maps from TEM
By Fundenberger J.-J. Morawiec A. Bouzy E. Lecomte J.S.
Ultramicroscopy, Vol. 96, Iss. 2, 2003-08 ,pp. :
Advances in crystal orientation mapping with the SEM and TEM
Ultramicroscopy, Vol. 67, Iss. 1, 1997-06 ,pp. :
TEM imaging and evalution of magnetic structures in Co/Cu multilayers
By Zweck J. Zimmermann T. Schuhrke T.
Ultramicroscopy, Vol. 67, Iss. 1, 1997-06 ,pp. :
Thickness determination by measuring electron transmission in the TEM at 200kV
By Pozsgai I.
Ultramicroscopy, Vol. 68, Iss. 1, 1997-05 ,pp. :