Element and phase identification via fine structure analysis in EELS: application to MOCVD-Y 1 Ba 2 Cu 3 O 7- thin films

Author： Grigis C.   Schamm S.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.74, Iss.3, 1998-08, pp. : 159-167

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