Annular dark-field image simulation of the YBa 2 Cu 3 O 7- /BaF 2 interface

Author: Lee J.L.   Silcox J.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.84, Iss.1, 2000-07, pp. : 65-74

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Abstract