Overabundant single-particle electron microscope views induce a three-dimensional reconstruction artifact

Author: Boisset N.   Penczek P.A.   Taveau J.-C.   You V.   de Haas F.   Lamy J.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.74, Iss.4, 1998-09, pp. : 201-207

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Abstract