Measurement of Debye-Waller factors by electron precession

Author: Midgley P.A.   Sleight M.E.   Saunders M.   Vincent R.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.75, Iss.2, 1998-11, pp. : 61-67

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Abstract