Measurement of three-dimensional intensity data in electron diffraction by the precession technique

By Berg B.S.   Hansen V.   Midgley P.A.   Gjonnes J.  

Ultramicroscopy, Vol. 74, Iss. 3, 1998-08 ,pp. : 147-157

Elsevier

Access to resources Recommend Favorite

A method to determine long-range order parameters from electron diffraction intensities detected by a CCD camera

By Kimoto T.   Takeda T.   Shida S.  

Ultramicroscopy, Vol. 96, Iss. 1, 2003-07 ,pp. : 105-116

Elsevier

Access to resources Recommend Favorite

Measurement of Debye-Waller factors by electron precession

By Midgley P.A.   Sleight M.E.   Saunders M.   Vincent R.  

Ultramicroscopy, Vol. 75, Iss. 2, 1998-11 ,pp. : 61-67

Elsevier

Access to resources Recommend Favorite

A high-resolution serial sectioning specimen preparation technique for application to electron backscatter diffraction

By Wall M.A.   Schwartz A.J.   Nguyen L.  

Ultramicroscopy, Vol. 88, Iss. 2, 2001-07 ,pp. : 73-83

Elsevier

Access to resources Recommend Favorite

Determination of interfacial residual stress field in an Al-Al 2 O 3 composite using convergent-beam electron diffraction technique

By Zou H.   Liu J.   Ding D.-h.   Wang R.   Froyen L.   Delaey L.  

Ultramicroscopy, Vol. 72, Iss. 1, 1998-04 ,pp. : 1-15

Elsevier

Access to resources Recommend Favorite