Atomic force microscopy for the analysis of environmental particles

Author: Ramirez-Aguilar K.A.   Lehmpuhl D.W.   Michel A.E.   Birks J.W.   Rowlen K.L.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.77, Iss.3, 1999-07, pp. : 187-194

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Abstract