Author: Ramirez-Aguilar K.A. Lehmpuhl D.W. Michel A.E. Birks J.W. Rowlen K.L.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.77, Iss.3, 1999-07, pp. : 187-194
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Abstract
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