Cross-sectional atomic force microscopy imaging of polycrystalline thin films

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Ultramicroscopy, Vol. 85, Iss. 2, 2000-10 ,pp. : 61-71

Elsevier

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Atomic force microscopy for the analysis of environmental particles

By Ramirez-Aguilar K.A.   Lehmpuhl D.W.   Michel A.E.   Birks J.W.   Rowlen K.L.  

Ultramicroscopy, Vol. 77, Iss. 3, 1999-07 ,pp. : 187-194

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Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopy

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Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. : 127-132

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Analysis of protein crystal growth at molecular resolution by atomic force microscopy

By Wiechmann M.   Enders O.   Zeilinger C.   Kolb H.-A.  

Ultramicroscopy, Vol. 86, Iss. 1, 2001-01 ,pp. : 159-166

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Developments for inverted atomic force microscopy

By Mabry J.C.   Yau T.   Yap H.   Green J.-B.D.  

Ultramicroscopy, Vol. 91, Iss. 1, 2002-05 ,pp. : 73-82

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