High-resolution imaging with an aberration-corrected transmission electron microscope

By Lentzen M.   Jahnen B.   Jia C.L.   Thust A.   Tillmann K.   Urban K.  

Ultramicroscopy, Vol. 92, Iss. 3, 2002-08 ,pp. : 233-242

Elsevier

Access to resources Recommend Favorite

Residual wave aberrations in the first spherical aberration corrected transmission electron microscope

By Uhlemann S.   Haider M.  

Ultramicroscopy, Vol. 72, Iss. 3, 1998-05 ,pp. : 109-119

Elsevier

Access to resources Recommend Favorite

A new method for the determination of the wave aberration function for high resolution TEM - 1. Measurement of the symmetric aberrations

By Meyer R.R.   Kirkland A.I.   Saxton W.O.  

Ultramicroscopy, Vol. 92, Iss. 2, 2002-07 ,pp. : 89-109

Elsevier

Access to resources Recommend Favorite

Instrumental factors in high-resolution FEG STEM

By von Harrach H.S.  

Ultramicroscopy, Vol. 58, Iss. 1, 1995-04 ,pp. : 1-5

Elsevier

Access to resources Recommend Favorite

Phase retrieval and aberration correction in the presence of vortices in high-resolution transmission electron microscopy

By Allen L.J.   Faulkner H.M.L.   Oxley M.P.   Paganin D.  

Ultramicroscopy, Vol. 88, Iss. 2, 2001-07 ,pp. : 85-97

Elsevier

Access to resources Recommend Favorite