High-resolution imaging with an aberration-corrected transmission electron microscope

Author： Lentzen M.   Jahnen B.   Jia C.L.   Thust A.   Tillmann K.   Urban K.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.92, Iss.3, 2002-08, pp. : 233-242

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