Optical depth profiling by attenuated total reflection Fourier transform infrared spectroscopy using an incident beam with arbitrary degree of polarization

Author： Ekgasit S.   Ishida H.  

Publisher： Elsevier

ISSN： 0924-2031

Source： Vibrational Spectroscopy, Vol.13, Iss.1, 1996-12, pp. : 1-9

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