A Behavior Model for Next Generation Test Systems

Author： Shombert L.A.  

Publisher： Springer Publishing Company

ISSN： 0923-8174

Source： Journal of Electronic Testing, Vol.13, Iss.3, 1998-12, pp. : 299-314

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Next generation maritime communication systems

By Maglogiannis Ilias   Hadjiefthymiades Sthathes   Panagiotarakis Nikos   Hartigan Patrick  

International Journal of Mobile Communications, Vol. 3, Iss. 3, 2005-03 ,pp. : 231-248

Inderscience Publishers

Access to resources Recommend Favorite

On the Use of Multiple Hops in Next Generation Wireless Systems

By Manoj B.  

Wireless Networks, Vol. 12, Iss. 2, 2006-04 ,pp. : 199-221

Springer Publishing Company

Access to resources Recommend Favorite

The next generation of systems to support corporate grade ICT products and solutions

By Wittgreffe J.   Trollope C.   Midwinter T.  

BT Technology Journal, Vol. 24, Iss. 4, 2006-10 ,pp. : 93-112

Springer Publishing Company

Access to resources Recommend Favorite

Test Generation Algorithm for Linear Systems Based on Genetic Algorithm

By Long Ting  

Journal of Electronic Testing, Vol. 26, Iss. 4, 2010-08 ,pp. : 419-428

Springer Publishing Company

Access to resources Recommend Favorite

Next generation knowledge management

By Davies J.   Studer R.   Sure Y.   Warren P.  

BT Technology Journal, Vol. 23, Iss. 3, 2005-07 ,pp. : 175-190

Springer Publishing Company

Access to resources Recommend Favorite