Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits

Author: Zjajo Amir   Pineda de Gyvez Jose   Gronthoud Guido  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.22, Iss.4-6, 2006-12, pp. : 399-409

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Abstract