Period of time: 2014年4-6期
Publisher: Springer Publishing Company
Founded in: 1990
Total resources: 50
ISSN: 0923-8174
Subject: TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Journal of Electronic Testing,volume 22,issue 4-6
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Test Development Through Defect and Test Escape Level Estimation for Data Converters
Journal of Electronic Testing,volume 22,issue 4-6 , Vol. 22, Iss. 4-6, 2006-12 , pp.A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave Fitting
Journal of Electronic Testing,volume 22,issue 4-6 , Vol. 22, Iss. 4-6, 2006-12 , pp.Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation
Journal of Electronic Testing,volume 22,issue 4-6 , Vol. 22, Iss. 4-6, 2006-12 , pp.A First Step for an INL Spectral-Based BIST: The Memory Optimization
Journal of Electronic Testing,volume 22,issue 4-6 , Vol. 22, Iss. 4-6, 2006-12 , pp.Investigation into the Use of Hybrid Solutions for ΣΔ A/D Converter Testing
By Georgopoulos K.,Lechner A.,Burbidge M.,Richardson A. in (2006)
Journal of Electronic Testing,volume 22,issue 4-6 , Vol. 22, Iss. 4-6, 2006-12 , pp.Towards Fault-Tolerant RF Front Ends
By Das Tejasvi,Gopalan Anand,Washburn Clyde,Mukund P. in (2006)
Journal of Electronic Testing,volume 22,issue 4-6 , Vol. 22, Iss. 4-6, 2006-12 , pp.On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay Lines
Journal of Electronic Testing,volume 22,issue 4-6 , Vol. 22, Iss. 4-6, 2006-12 , pp.