Evaluating Different Solutions to Design Fault Tolerant Systems with SRAM-based FPGAs

Author: Sterpone L.   Sonza Reorda M.   Violante M.   Kastensmidt F.   Carro L.  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.23, Iss.1, 2007-02, pp. : 47-54

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Abstract