Microstructure characterisation of ALD-grown epitaxial SnO 2 thin films

Author: Lu J.   Sundqvist J.   Ottosson M.   Tarre A.   Rosental A.   Aarik J.   Harsta A.  

Publisher: Elsevier

ISSN: 0022-0248

Source: Journal of Crystal Growth, Vol.260, Iss.1, 2004-01, pp. : 191-200

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract