Experimental characterization of peripheral photocurrent in CMOS photodiodes down to 65 nm technology

Author： Blanco-Filgueira B.   López P.   Roldán J.B.  

Publisher： IOP Publishing

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.28, Iss.4, 2013-04, pp. : 45011-45017

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