Automatic parameter extraction techniques in IC-CAP for a compact double gate MOSFET model

Author： Darbandy Ghader   Gneiting Thomas   Alius Heidrun   Alvarado Joaquín   Cerdeira Antonio   Iñiguez Benjamin  

Publisher： IOP Publishing

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.28, Iss.5, 2013-05, pp. : 55014-55021

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