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Defect Chemistry of Y Doped BaTiO 3

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Microstructure analysis of the Y5V multilayer ceramic capacitors based on BaTiO 3

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Atomic Force Microscopy Examination of the Evolution of the Surface Morphology of \hbox{Bi}_{4}\hbox{Ti}_{3}\hbox{O}_{12} grown by Molecular Beam Epitaxy

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Journal of Electroceramics, Vol. 4, Iss. 2-3, 2000-06 ,pp. : 351-356

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