Atomic Force Microscopy Examination of the Evolution of the Surface Morphology of \hbox{Bi}_{4}\hbox{Ti}_{3}\hbox{O}_{12} grown by Molecular Beam Epitaxy

Author: Brown G.W.  

Publisher: Springer Publishing Company

ISSN: 1385-3449

Source: Journal of Electroceramics, Vol.4, Iss.2-3, 2000-06, pp. : 351-356

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract