The Effect of Stress on the Microwave Dielectric Properties of \hbox{Ba}_{0.5}\hbox{Sr}_{0.5}\hbox{TiO}_{3} Thin Films

By Horwitz J.S.   Chang W.   Kim W.   Qadri S.B.   Pond J.M.   Kirchoefer S.W.   Chrisey D.B.  

Journal of Electroceramics, Vol. 4, Iss. 2-3, 2000-06 ,pp. : 357-363

Springer Publishing Company

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Dielectric Properties of Homoepitaxial \hbox{SrTiO}_{3} Thin Films Grown in the Step-Flow Mode

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Journal of Electroceramics, Vol. 4, Iss. 2-3, 2000-06 ,pp. : 365-368

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Ferroelectric Properties of the \hbox{La}_{0.03}\hbox{Sr}_{0.255}\hbox{Ba}_{0.7}\hbox{Nb}_{2\minus y}\hbox{Ti}_{y}\hbox{O}_{6\minus y/2} Ceramic System*

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Journal of Electroceramics, Vol. 3, Iss. 4, 1999-10 ,pp. : 371-375

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Relaxor Behavior of (\hbox{Sr}_{0.8}\hbox{Ba}_{0.2})\hbox{TiO}_{3} Ceramic Solid Solution Doped with Bismuth

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Structure and Properties of Hot-Pressed \hbox{Pb}(\hbox{Lu}_{1/2}\hbox{Nb}_{1/2})\hbox{O}_{3}\hbox{-PbTiO}_{3} Binary System Ceramics*

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Journal of Electroceramics, Vol. 4, Iss. 1, 2000-03 ,pp. : 179-187

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