The Effect of Stress on the Microwave Dielectric Properties of \hbox{Ba}_{0.5}\hbox{Sr}_{0.5}\hbox{TiO}_{3} Thin Films

Author: Horwitz J.S.   Chang W.   Kim W.   Qadri S.B.   Pond J.M.   Kirchoefer S.W.   Chrisey D.B.  

Publisher: Springer Publishing Company

ISSN: 1385-3449

Source: Journal of Electroceramics, Vol.4, Iss.2-3, 2000-06, pp. : 357-363

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