Author: Lee P. Hwu R. Sadwick L. Balasubramaniam H. Kumar B. Alvis R. Lareau R. Wood M.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.27, Iss.5, 1998-05, pp. : 405-408
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Temperature effects of low noise InGaP/InGaAs/GaAs PHEMTs
By Huang H.K. Wang C.S. Wang Y.H. Wu C.L. Chang C.S.
Solid-State Electronics, Vol. 47, Iss. 11, 2003-11 ,pp. :