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Author: Rujirawat S. Smith David Faurie J. Neu G. Nathan V. Sivananthan S.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.27, Iss.9, 1998-09, pp. : 1047-1052
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
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