Author: Ressel P. Hao P. Park M. Yang Z. Wang L. Österle W. Kurpas P. Richter E. Kuphal E. Hartnagel H.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.29, Iss.7, 2000-07, pp. : 964-972
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