Study of interface traps from transient photoconductive decay measurements in passivated HgCdTe

Author： Pal R. Gopal V. Chaudhury P. Sharma B. Basu P. Agnihotri O. Kumar V.

ISSN： 1543-186X

Source： Journal of Electronic Materials, Vol.30, Iss.2, 2001-02, pp. : 103-108

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