Author: Aifer E.
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.39, Iss.7, 2010-07, pp. : 1070-1079
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Radiation Damage in Type II Superlattice Infrared Detectors
By Jackson E.M.
Journal of Electronic Materials, Vol. 39, Iss. 7, 2010-07 ,pp. :
By Guo Xiaolu Wenquan Huang Jianliang Zhang Yanhua Wei Yang Cui Kai Cao Yulian Li Qiong
Semiconductor Science and Technology, Vol. 28, Iss. 4, 2013-04 ,pp. :