![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Dion Joseph
Publisher: Springer Publishing Company
ISSN: 1543-186X
Source: Journal of Electronic Materials, Vol.40, Iss.4, 2011-04, pp. : 377-381
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Hussain Sakhawat Lekhal Kaddour Kim-Chauveau Hyonju Vennéguès Philippe Damilano Benjamin
Semiconductor Science and Technology, Vol. 29, Iss. 3, 2014-03 ,pp. :