FTIR and XPS investigation of Er-doped SiO 2 -TiO 2 films

Author： Fang Q. Meier M. Yu J.J. Wang Z.M. Zhang J.-Y. Wu J.X. Kenyon A. Hoffmann P. Boyd I.W.

Publisher： Elsevier

ISSN： 0921-5107

Source： Materials Science and Engineering: B, Vol.105, Iss.1, 2003-12, pp. : 208-212

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