Diagnosis of Incipient Faults in Weak Nonlinear Analog Circuits

By Shi Yibing   Deng Yong   Zhang Wei  

Circuits, Systems, and Signal Processing, Vol. 32, Iss. 5, 2013-10 ,pp. : 2151-2170

Springer Publishing Company

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Fault Diagnosis of Nonlinear Analog Circuits Using Neural Networks with Wavelet and Fourier Transforms as Preprocessors

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Journal of Electronic Testing, Vol. 17, Iss. 6, 2001-12 ,pp. : 471-481

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Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model

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Journal of Electronic Testing, Vol. 27, Iss. 3, 2011-06 ,pp. : 321-334

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Symbolic Determinant Decision Diagrams and Their Use for Symbolic Modeling of Linear Analog Integrated Circuits

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Analog Integrated Circuits and Signal Processing, Vol. 31, Iss. 2, 2002-05 ,pp. : 119-130

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Structural Fault Modeling and Fault Detection Through Neyman–Pearson Decision Criteria for Analog Integrated Circuits

By Zjajo Amir   Pineda de Gyvez Jose   Gronthoud Guido  

Journal of Electronic Testing, Vol. 22, Iss. 4-6, 2006-12 ,pp. : 399-409

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