Author: Kolesik M.
Publisher: Springer Publishing Company
ISSN: 0946-2171
Source: Applied Physics B, Vol.79, Iss.3, 2004-08, pp. : 293-300
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Sub-micron patterning of solid materials with ultraviolet femtosecond pulses
Applied Physics A, Vol. 79, Iss. 4-6, 2004-09 ,pp. :
Size effects in the deformation of sub-micron Au columns
By Volkert C. A. Lilleodden E. T.
Philosophical Magazine, Vol. 86, Iss. 33-35, 2006-01 ,pp. :
A review of analysis methods for sub-micron indentation testing
Vacuum, Vol. 58, Iss. 4, 2000-09 ,pp. :