Composition analysis of single semiconductor nanowires using pulsed-laser atom probe tomography

Author： Perea D.E. Lensch J.L. May S.J. Wessels B.W. Lauhon L.J.

ISSN： 0947-8396

Source： Applied Physics A, Vol.85, Iss.3, 2006-11, pp. : 271-275

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