X-ray and transmission electron microscopy characterization of twinned CdO thin films grown on a -plane sapphire by metalorganic vapour phase epitaxy

Author: Martínez-Tomás M.C.   Zúñiga-Pérez J.   Vennéguès P.   Tottereau O.   Muñoz-Sanjosé V.  

Publisher: Springer Publishing Company

ISSN: 0947-8396

Source: Applied Physics A, Vol.88, Iss.1, 2007-07, pp. : 61-64

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