Investigation of silicon structures with periodically varying porosity by x-ray diffractometry methods

Author： Irzhak D. Roshchupkin D. Starkov V. Fakhrtdinov R.

ISSN： 1027-4510

Source： Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol.4, Iss.6, 2010-11, pp. : 947-950

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Determining the porosity of synthetic opals and porous silicon by x-ray methods

By Ratnikov V.

Physics of the Solid State, Vol. 39, Iss. 5, 1997-05 ,pp. : 856-858

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

X-ray diffractometry diagnosis of laser diffusion of aluminum into silicon

By Bushuev V. Petrakov A.

Technical Physics, Vol. 45, Iss. 5, 2000-05 ,pp. : 613-617

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Investigation on the Spontaneous Strain and Ferroelastic Domain Structures in NdP5O14 Crystals by High Resolution X-Ray Diffractometry

By Hu X. B. Wang J. Y. Liu H. Guo M. Pan H. F. Jiang H. D. Zhang H. J. Wu X. S. Jiang S. S.

Ferroelectrics, Vol. 274, Iss. 1, 2002-01 ,pp. : 157-163

Taylor & Francis Ltd

Access to resources Recommend Favorite

Adaptation of a furnace for X-ray diffractometry.

Journal de Physique et le Radium, Vol. 19, Iss. 6, 1958-06 ,pp. : 616-616

Edp Sciences

Access to resources Recommend Favorite

X-RAY TOPOGRAPHIC INVESTIGATION OF FERROMAGNETIC DOMAIN STRUCTURES WITH CLOSURE DOMAIN CONFIGURATIONS IN IRON-SILICON SINGLE CRYSTALS

Le Journal de Physique Colloques, Vol. 32, Iss. C1, 1971-02 ,pp. : C1-256-C1-258

Edp Sciences

Access to resources Recommend Favorite